Thermo Fisher Scientific Themis Z
The aberration-corrected Titan Themis-Z is one of our two high-end transmission electron microscopes (TEM) for materials science. The instrument is a analytical TEM used to answer the most complex questions regarding materials science. By eliminating the inherent optical imperfections of image and probe forming lenses, the Themis-Z enables a clear view on even single atoms. An ultimate information transfer at a resolution equal to the diameter of a hydrogen atom is obtained. The instrument has a bright and coherent field-emission electron emitter with a monochromator, to achieve a formidable energy resolution combined with a high-resolution energy filter. The addition of the high-sensitivity X-ray spectrometer creates a high-performance analytical instrument perfectly suited for the nanoanalytical characterization of many kinds of solid-state and soft materials.
Applications
Imaging and analytic measurements of the microstructure, chemical composition, and optical properties of nanomaterials and soft matter, thin films, devices, interfaces, on the nanometer and atomic scale.
Thermo Fisher Scientific Titan Krios G3i
The Titan Krios is the most powerful and most flexible electron microscope in the world to provide high-resolution images of biological samples - both in 2D and 3D mode. This microscope allows data acquisition of purified proteins and their complexes to the highest possible resolutions. Depending on the specimen, the microscope yields structural data of two to four ångström. Data collection is fully automated, the many thousand high-resolution images required to build a 3D model of a molecule by single particle analysis are recorded during few days of non-stop operation. The microscope is perfectly suited for cryo-electron tomography of protein complexes and cellular compartments and other biological samples.
Applications
High-throughput, high-resolution 2D and 3D imaging and structural elucidation of proteins, cells ,and other biological specimens.
Bruker - Vutara 352 Super-Resolution Fluorescence Microscope
The Vutara 352 is a powerful and novel microscope provides high-resolution images of biological samples – both in 2D and 3D. The improved resolution, tenfold better than the conventional light microscopes, allows to observe biological objects such as cells with exquisite detail at the level of single molecules. The instrument is designed as a platform for various imaging techniques such as stochastic optical reconstruction microscopy (STORM), photo-activated localization microscopy (PALM), and single molecule tracking.
Applications
Super resolution imaging and correlative light and electron microscopy (CLEM) of wide variety biological specimens.
Zeiss GeminiSEM 500
The GeminiSEM 500 is one of the most advanced high resolution scanning electron microscope (SEM) for materials science research. The instrument is a powerful imaging and analytical tool for almost any solid sample that can found on earth or synthesized in the laboratory. It works both at high vacum mode and low vacuum so any sample can be imaged as is, even if it’s not conductive (for instance polymeric materials or ceramics). It is equipped with many electrons detectors, thus enable to get surface and morphology information simultaneously with composition information. In addition, x-ray and light special detectors and spectrometers can give insight into the chemistry of the sample. Many samples such as archeological and geological materials to nanoscale materials are studied using this advanced tool.
Applications
Imaging and analytic measurements on the nanometer scale, including: morphology, structure, chemical composition, and optical properties of inorganic and organic materials, soft and bio matter, thin films, devices, interfaces and more.
ZEISS CrossBeam 550
The CrossBeam 550 is a high technology dual-beam instrument that integrates a Focused Ion Beam (FIB) with a Scanning Electron Microscope (SEM). The FIB can be used for precise removal and patterning on specimens, while simultaneously obtaining high-resolution nondestructive SEM imaging with the electron beam.
The Crossbeam FIB-SEM allows for numerous applications and complex workflows, like cross-sectioning and fabrication, FIB-SEM 2-dimensional tomography, 3D analytics of material properties, thin-layer sample preparation for transmission electron microscopy, and nanoscale patterning. The workflows are applicable for a wild range of materials and their combinations, at room temperature and cryogenic conditions.