Electron Spectroscopy Lab tools

  • X-ray photoelectron spectroscopy (XPS) – a quantitative analytical probe providing the surface (outer ~10 nm) composition, elemental oxidation states, as well as high-resolution information on the arrangement of surface atoms along the vertical axis. Lateral mapping of surface elemental concentrations can be obtained at 3 µm resolution.
  • Ultraviolet photoelectron spectroscopy (UPS) – a technique for measuring at improved energy resolution the valence-electron energy bands and the secondary electron emission (SEE) spectrum. UPS can also be used to derive the sample work-function.
  • Scanning Auger microscopy (SAM) – a technique complementary to XPS, providing the surface chemical analysis at improved lateral resolution, down to 200 nm in our setup.
  • Ion scattering spectroscopy (ISS) with an Ar+ or He+ source beam, offering complementary chemical information at improved surface sensitivity.
  • CREM (Chemically Resolved Electrical Measurements) – a novel XPS-based technique that was developed in our lab to provide nm-scale electrical information from selected surface and sub-surface domains. This includes (1) I-V curves of inner layers; (2) sub-surface mapping of electric fields; (3) domain-specific photovoltages; (4) atomic-scale electrical information in organic molecular layers; (5) constructing the band diagrams of heterostructures; (5) hot-electron transport characteristics in e.g. gate oxides; (6) novel pyroelectricity measurements; and more.

Optical Spectroscopy and Microscopy

The Optical Spectroscopy and Microscopy lab uses the following tools:

  • Optical Pump – Terahertz Probe time domain spectroscopy allows us to follow the dynamics of charge carriers for research in many fields such as photovoltaic systems, water dynamics, and protein dynamics.
  • Confocal Raman microscopy system can measure the vibrational spectra of most non-metallic samples. We can monitor processes in a range of temperatures and even under strain or at different potential states.
  • CD (circular dichroism), and UV-VIS spectroscopy of opaque and scattering media complete the range of instrumentation in the lab.

Magnetic Resonance Core Facilities

  • The NMR lab, part of the Magnetic Resonance Core Facilities, houses six high-resolution Bruker NMR spectrometers ranging from 300-1000 MHz, which are equipped with a variety of probes for solution- as well as for solid-state NMR studies. Specifically, Bruker AVANCE III-400WB, the UltraShield AVANCE III HD-500 and AVANCE III-800 spectrometers are all equipped with solid-state capabilities.
  • The EPR lab under the Magnetic Resonance Core Facilities houses an upgraded Bruker’s EleXsys-580 FT/CW EPR spectrometer operating at X-band (9.5GHz) and Q-band (35 GHz) frequencies, which amongst other capabilities enables time resolved EPR measurements upon photoexcitation.

Electron Spectroscopy Lab | Ultraviolet photoelectron spectroscopy (UPS)

The Ultraviolet photoelectron spectroscopy (UPS) is a technique for measuring at improved energy resolution the valence-electron energy bands and the secondary electron emission (SEE) spectrum. UPS can also be used to derive the sample work-function.

Electron Spectroscopy Lab: X-ray photoelectron spectroscopy (XPS)

The X-ray photoelectron spectroscopy (XPS) is a quantitative analytical probe providing the surface (outer ~10 nm) composition, elemental oxidation states, as well as high-resolution information on the arrangement of surface atoms along the vertical axis. Lateral mapping of surface elemental concentrations can be obtained at 3 µm resolution.